Semiconductor Probes半導體封裝測試探針系列
- NCPM-011FD3.25L Probe
- NCPM-011BB5.7L Probe
- NCPM-015D1B5.2L Probe
- NCPM-015BB5.7L Probe
- NCPM-020BB5.7L Probe
- NCPM-026BB12.3L Probe
- NCPM-026FB5.9L Probe
- NCPM-028BB5.7L Probe
- NCPM-029BB5.7L Probe
- NCPM-029BB6.7L Probe
- NCPM-031UB2.55L Probe
- NCPM-031UB3.0L Probe
- NCPM-031UB3.3L Probe
- NCPM-031UU3.9L Probe
- NCPM-031UB4.15L Probe
- NCPM-031UJ4.75L Probe
- NCPM-031UJ4.5L Probe
- NCPM-031JU5.0L Probe
- NCPM-031UU5.7L Probe
- NCPM-031FF6.7L Probe
- NCPM-035UB2.0L Probe
- NCPM-035BB4.0L Probe
- NCPM-035UB4.2L Probe
- NCPM-035FB5.6L Probe
- NCPM-035UU7L Probe
- NCPM-035UB8.65L Probe
- NCPM-035FB7.62L Probe
- NCPM-038UB3.1L Probe
- NCPM-038UB3.2L Probe
- NCPM-038FJ4.8L Probe
- NCPM-038UB5.7L Probe
- NCPM-038BU5.7L Probe
- NCPM-038VF4.6L Probe
- NCPM-040BF5.3L Probe
- NCPM-046BB5.7L Probe
- NCPM-048UB4L Probe
- NCPM-051UB3.3L Probe
- NCPM-051UB3.4L Probe
- NCPM-051FB3.7L Probe
- NCPM-051FB4.8L Probe
- NCPM-051BB5.7L Probe
- NCPM-057FB3L Probe
- NCPM-057FF3.1L Probe
- NCPM-057FB4.8L Probe
- NCPM-058FB5.7L Probe
- NCPM-058FB8.65L Probe
- NCPM-061FB5.8L Probe
- NCPM-078FB8.65L Probe
- NCPM-081FJ3.3L Probe
- NCPM-083UJ13L Probe
- NCPM-086FU2.9L Probe
- NCPM-084FB5.8L Probe
- NCPM-028FB3.0L Probe
- NCPM-029FB3.9L Probe
- NCPM-031FB3.3L Probe
- NCPM-032BB2.7L Probe
- NCPM-035FJ3.2L Probe
- NCPM-037UF4.65L Probe
- NCPM-038UU8.0L Probe
- NCPM-047FJ3.8L Probe
- NCPM-047UU4.8L Probe
- NCPM-051FF1.55L Probe
- NCPM-052FB2.5L Probe
- NCPM-052FB3.3L Probe
- NCPM-052FF3.65L Probe
- NCPM-064FF4.9L Probe
- NCPM-065FF5.2L Probe
- NCPM-067FB4.46L Probe
- NCPM-070FJ5.84L Probe
- NCPM-075FF3.3L Probe
- NCPM-075FF4.3L Probe
- NCPM-085FF4.8L Probe
產品詳細
產品詳情
NCPM-081FJ3.3L Probe
PRODUCT DETAIL
Material
Plunger : BeCu / Au Plated
Plunger : BeCu / Au Plated
Barrel : PhBz / Au Plated
Spring : SWP / Au Plated
Mechanical
Full Travel : 0.80 mm
Spring Force :29g ± 20% at 0.70 mm
Electrical
Current Rating : 3.0A
Contact Resistance : < 50 mΩ (AVG)
Bandwidth : >25GHz@ -3dB
